Advanced Imaging and Materials Characterisation Techniques
This module provides an introduction to the principles of microscopy and spectroscopy.
£300 per person
Who should attend?
Anybody currently working with samples which utilise light and electron microscopy techniques. Attendees do not need to have any formal qualifications but will require some technical knowledge.
- An understanding of best practise in light and electron microscopy.
- Opportunity to operate state of the art equipment at Swansea University Advanced Imaging of Materials (AIM) department.
- Practical use of microscopy equipment leading to optimisation of time and improvement of results.
- A practical understanding of the importance of sample preparation.
- Potential to improve productivity and quality standards.
Course programmeTheory and understanding of the methods that underpin a wide range of characterisation techniques. Practical implementation of this knowledge by undertaking the following:
- Sample preparation techniques including metallography and ion beam milling
- Carbon and metal coating
- High quality imaging of metals and non-metals
- Light microscopy including compound and extended depth of field microscopes
- Scanning electron microscopy (secondary, backscatter and variable pressure)
- Energy dispersive electron spectroscopy for chemical composition analysis
- Advanced post processing software
Assessment2 hour written exam.
DatesDay 1: Wednesday 22nd January
Day 2: Thursday 23rd January
Day 3: Friday 24th January
Date of assessment to be confirmed with attendee.
LocationSwansea University Bay Campus
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